中图分类号：TP332；TN406 文献标志码：A DOI: 10.16157/j.issn.0258-7998.246194
中文引用格式： 黄强，廖述京，赖文彬，等. 高性能RISC-V处理器抗辐照加固设计[J]. 电子技术应用，2025，51(8)：108-113.
英文引用格式： Huang Qiang，Liao Shujing，Lai Wenbin，et al. Design of radiation hardened based on the high performance RISC-V processor[J]. Application of Electronic Technique，2025，51(8)：108-113.

Design of radiation hardened based on the high performance RISC-V processor

Abstract： With the rapid development of space technology, the reliability of chips in the irradiation environment becomes more and more prominent. In this paper, based on the RISC-V architecture high-performance processor C501, the triple modular redundancy and error detection and correction are used to harden the circuit level and system level respectively. At the same time, the strategy of memory access request forcing miss is adopted to correct the data block of check error, so as to improve the error-correcting ability of the cache system. The simulation outcomes indicate that the radiation harden processor is capable of rectifying cache data errors caused by irradiation. At the same time, the maximum working frequency has witnessed a decrement of 8.8%, the area increased by 64.9%, while the performance level has been maintained.

Key words : RISC-V；design of radiation hardened；triple modular redundancy；error detection and correction